Ceramics-Silikáty 37, (1) 1 - 6 (1993)

Silver ions were incorporated into the surface of Simax glass at 335 °C under the effect of a constant direct current (10-40 mA). The distribution of silver ions was determined in the surface layers obtained. Concentration profiles prepared at higher direct current values (I ˃ 20 mA) are distinguished for rectangular shape e.g. diffusion movement of silver ions can be neglected and the concentration distribution in the surface layers is practically homogenous. The thickness of such kind of surface layers can be predicted theoretically if the corresponding velocity of shift of concentration edge is known. Theoretical calculations are in satisfactory agreement with the values determined experimentally. Concentration profiles originated at lower direct current values (I = 10 and 15 mA resp.) can be considered as a sum of diffusion movement and a shift of silver ions due to the influence of electrical field.