Ceramics-Silikáty 59, (3) 187 - 193 (2015) |
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THE RAMAN SPECTROSCOPY USE FOR MONITORING OF CHANGES IN THE GLASS STRUCTURE OF THE THIN LAYERS CAUSED BY ION IMPLANTATION
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Nekvindova Pavla 1, Svecova B. , Stanek S. 1, Vytykacova S. 1, Mackova A. 3,2, Malinsky P. 3,2, Machovic V. 1, Spirkova J. 1
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1 Department of Inorganic Chemistry, Faculty of Chemical Technology, University of Chemistry and Technology, Technicka 5, 166 28 Prague, Czech Republic
2 Nuclear Physics Institute, Academy of Sciences of the Czech Republic, v.v.i., 250 68 Rez, Czech Republic
3 Department of Physics, Faculty of Science, J. E. Purkinje University, Ceske mladeze 8, 400 96 Usti nad Labem, Czech Republic
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Keywords: Glasses, Nano particles, Raman spectroscopy, Ion implantation
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In this paper, we have demonstrated the utility of Raman spectroscopy as a technique for the characterisation of changes in the glass structure of the thin layers caused by ion implantation. Various types of silicate glasses were implanted by Au+ ions with energy of 1.7 MeV and a fluence of 1 x 1016 ions.cm-2 to create gold nanoparticles in thin sub-surface layer of the glass. It was proved that the structure of the glass has an indisputable impact on the extent of depolymerisation of the glass network after implantation. It was shown that the degree of glass matrix depolymerisation can be described using the evaluation of Qn factors in the implanted layers from different depths. After analysis of Raman spectra, the relation between nucleation and the resulting parameters of the gold nanoparticles was put into connection with the feasibility of the glass to recover its structure during post-implantation annealing. Also the creation of new bonds in the glass network was discussed. |
Record in: Scopus | Web of Science |
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